Rapid smart approach for reliability and failure mode analysis of memories and large systems

被引：0
|
作者：
Mehdi, K.A. [1 ]
Kontoleon, J.M. [1 ]
机构：
[1] Aristotle Univ of Thessaloniki, Thessaloniki, Greece
来源：
Microelectronics Reliability | 1996年 / 36卷 / 10期
关键词：
Acknowledgement--The authors wish to thank the Greek Ministry of Research and Technology for the provided support;
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摘要：
3
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页码：1547 / 1556
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