High/low-precision digital speckle pattern interferometry for vibration measurement

被引：0
|
作者：
Jia, Shuhai [1 ]
Yue, Kaiduan [1 ]
Zhao, Hong [1 ]
Tan, Yushan [1 ]
机构：
[1] Xi'an Jiaotong Univ, Xi'an, China
来源：
Hsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong University | 2000年 / 34卷 / 09期
关键词：
Digital devices - Interferometry - Light interference - Phase shift - Vibration measurement;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
High/low-precision digital speckle pattern interferometry (DSPI) is proposed for measuring vibration. The system combines the common DSPI optical path for measuring out-plane vibration and the de-sensitized optical path. High and low precision measurements are made such that the wrapped phase map obtained with high precision can be unwrapped according to that for the low precision. The effectiveness of the unwrapping procedure at the discontinuous area makes it possible to analyze the vibration characteristics of a complex and discontinuous structure for engineering application.
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页码：72 / 76
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