High temperature superconductor thin-film characterization by the modulated optical reflectance technique

被引：0
|
作者：
Almond, D.P. [1 ]
Barker, A.K. [1 ]
Bento, A.C. [1 ]
Singh, S.K. [1 ]
Appleyard, N.J. [1 ]
Jackson, T.J. [1 ]
Palmer, S.B. [1 ]
机构：
[1] Univ of Bath, Bath, United Kingdom
来源：
Superconductor Science and Technology | 1995年 / 8卷 / 08期
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7
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页码：667 / 672
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