Studying the effects of organic contaminants on the head/disk interface with a new test system

被引：0

作者：

Koka, Ramesh ^{[1
]}

机构：

[1] formerly of IBM-Adstar, Rochester, United States

来源：

Microcontamination | 1993年 / 11卷 / 09期

关键词：

10;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：41 / 46

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