PHOTO-INDUCED CURRENT TRANSIENT SPECTROSCOPY IN HIGH-RESISTIVITY BULK MATERIAL. I. COMPUTER CONTROLLED MULTI-CHANNEL PICTS SYSTEM WITH HIGH-RESOLUTION.

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Yoshie, Osamu

Kamihara, Mitsuo

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| 1600年 / 22期

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[1] PHOTOINDUCED CURRENT TRANSIENT SPECTROSCOPY IN HIGH-RESISTIVITY BULK MATERIAL .1. COMPUTER-CONTROLLED MULTI-CHANNEL PICTS SYSTEM WITH HIGH-RESOLUTION
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JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1983, 22 (04): : 621 - 628
[2] PHOTO-INDUCED CURRENT TRANSIENT SPECTROSCOPY IN HIGH-RESISTIVITY BULK MATERIAL. III. SCANNING-PICTS SYSTEM FOR IMAGING SPATIAL DISTRIBUTIONS OF DEEP-TRAPS IN SEMI-INSULATING GaAs WAFER.
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1600, (24):
[3] On deep levels in high-resistivity LEC-GaAs investigated by means of photo induced current transient spectroscopy
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[4] PHOTOINDUCED CURRENT TRANSIENT SPECTROSCOPY IN HIGH-RESISTIVITY BULK MATERIAL .3. SCANNING-PICTS SYSTEM FOR IMAGING SPATIAL DISTRIBUTIONS OF DEEP-TRAPS IN SEMI-INSULATING GAAS WAFER
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[5] PHOTOINDUCED CURRENT TRANSIENT SPECTROSCOPY IN HIGH-RESISTIVITY BULK MATERIAL .2. INFLUENCE OF NON-EXPONENTIAL TRANSIENT ON DETERMINATION OF DEEP TRAP PARAMETERS
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JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1983, 22 (04): : 629 - 635