Determining the material structure of microcrystalline silicon from Raman spectra

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[1] [1,Smit, C.
[2] Van Swaaij, R.A.C.M.M.
[3] Donker, H.
[4] Petit, A.M.H.N.
[5] Kessels, W.M.M.
[6] Van de Sanden, M.C.M.
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Van Swaaij, R.A.C.M.M. (r.vanswaaij@dimes.tudelft.nl) | 1600年 / American Institute of Physics Inc.卷 / 94期
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