ON THE QUALITY OF CONTACTS IN a-Si:H STAGGERED ELECTRODE THIN-FILM TRANSISTORS.

被引:0
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作者
Schropp, Ruud E.I. [1 ]
Veltkamp, Joost W.C. [1 ]
Snijder, Jan [1 ]
Verwey, Jan F. [1 ]
机构
[1] Univ of Groningen, Dep of Applied Physics, Neth, Univ of Groningen, Dep of Applied Physics, Neth
关键词
FIELD-EFFECT (FE) MEASUREMENTS - RESIDUAL SERIES RESISTANCE - STAGGERED ELECTRODE STRUCTURES - THIN-FILM TRANSISTORS (TFT);
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页码:1757 / 1760
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