The article demonstrates the temperature dependence of the minimum connecting current, the differential voltage and the coupling frequency. The parameters of integrated circuits manufactured with different methods are tested and their temperature dependence referred to. 3 refs.
机构:
Int Lab of Strong Magnetic Fields, & Low Temperatures, Wroclaw, Pol, Int Lab of Strong Magnetic Fields & Low Temperatures, Wroclaw, PolInt Lab of Strong Magnetic Fields, & Low Temperatures, Wroclaw, Pol, Int Lab of Strong Magnetic Fields & Low Temperatures, Wroclaw, Pol
Bazan, C.
Matyjasik, S.
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机构:
Int Lab of Strong Magnetic Fields, & Low Temperatures, Wroclaw, Pol, Int Lab of Strong Magnetic Fields & Low Temperatures, Wroclaw, PolInt Lab of Strong Magnetic Fields, & Low Temperatures, Wroclaw, Pol, Int Lab of Strong Magnetic Fields & Low Temperatures, Wroclaw, Pol
Matyjasik, S.
Instruments and experimental techniques New York,
1986,
29
(3 pt 2):
: 750
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752
机构:
Univ of Tennessee, Knoxville, TN,, USA, Univ of Tennessee, Knoxville, TN, USAUniv of Tennessee, Knoxville, TN,, USA, Univ of Tennessee, Knoxville, TN, USA
Chohan, R.K.
Kerlin, T.W.
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h-index: 0
机构:
Univ of Tennessee, Knoxville, TN,, USA, Univ of Tennessee, Knoxville, TN, USAUniv of Tennessee, Knoxville, TN,, USA, Univ of Tennessee, Knoxville, TN, USA
机构:
Acad of Sciences of the USSR, Mining, Inst, Novosibirsk, USSR, Acad of Sciences of the USSR, Mining Inst, Novosibirsk, USSRAcad of Sciences of the USSR, Mining, Inst, Novosibirsk, USSR, Acad of Sciences of the USSR, Mining Inst, Novosibirsk, USSR