Microcavity effects in thin-film electroluminescence

被引：0
|
作者：
Mueller, Gerd O. [1 ]
Mueller-Mach, Regina [1 ]
Alinsog, Elmer [1 ]
Lee, Hakchu [1 ]
Harrison, Douglas [1 ]
机构：
[1] Hewlett Packard Lab, Fremont, United States
来源：
Journal of Luminescence | 1997年 / 72-74卷
关键词：
Electronic density of states - Fabry-Perot interferometers - Luminescent devices - Semiconducting zinc compounds - Spectrum analysis - Thin film devices;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Putting thin-film electroluminescent device stacks of the dielectric-sandwiched type on top of a dielectric reflector modifies the spectral and angular distribution of emission by introducing the Fabry-Perot mode structure into the final state density of the matrix elements. Experimental results for Fabry-Perots of about 10-quarter wavelength optical thickness are given.
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页码：1002 / 1004
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