Fundamentals of Reliability Explained by Means of the Reliability of Components.

被引：0

|

作者：

Bajenescu, T.I.

机构：

来源：

Elektronik Produktion & Prueftechnik | 1981年 / 05期

关键词：

Engineering Village;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

下载

收藏

页码：191 / 193

相关论文

共 50 条

[1] Thermal reliability studies of optoelectronic components.
Hughes, PJ
Healy, G
Llinares, X
Akhter, M
Justice, J
O'Brien, S
Alderman, JA
Crean, G
OPTO-IRELAND 2002: OPTICS AND PHOTONICS TECHNOLOGIES AND APPLICATIONS, PTS 1 AND 2, 2003, 4876 : 452 - 461
[2] COLLECTION OF RELIABILITY DATA ON ELECTRONIC COMPONENTS.
Boswell, David
Quality assurance London, 1981, 7 (02): : 36 - 37
[3] Performance and reliability of commercial polymer waveguide components.
Lipscomb, GF
Thackara, JI
DeDobbelaere, P
Ticknor, AJ
Flipse, MC
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1998, 216 : U146 - U146
[4] RELIABILITY EVALUATION OF MULTISTATE SYSTEMS WITH MULTISTATE COMPONENTS.
Aven, Terje
IEEE Transactions on Reliability, 1985, R-34 (05) : 473 - 479
[5] Reliability Calculation with Consideration of the Character of Possible Failure of Components.
Kostenko, N.A.
Problemy Prochnosti, 1974, 6 (06): : 84 - 88
[6] BOUNDS ON RELIABILITY OF A COHERENT SYSTEM WITH POSITIVELY CORRELATED COMPONENTS.
Lai, C.D.
IEEE Transactions on Reliability, 1986, R-35 (05) : 508 - 511
[7] Reliability Step-Stress Tests of Electronic Components.
Hudoklin, Alenka
Rozman, Vojan
Elektrotehniski Vestnik/Electrotechnical Review, 1986, 53 (01): : 27 - 33
[8] Method of Rating Reliability Characteristics of Lighting Installations with Individual Replacement of Components.
D'yakonova, E.V.
Litvinov, V.S.
Rozhkova, N.V.
Svetotekhnika, 1976, (07): : 5 - 8
[9] BAYESIAN SHRINKAGE ESTIMATION OF RELIABILITY IN PARALLEL SYSTEM WITH EXPONENTIAL FAILURE OF THE COMPONENTS.
Pandey, M.
Upadhyay, S.K.
1600, (25):
[10] BASELINE ANALYSIS - AN EFFECTIVE METHOD FOR MAINTAINING HIGH RELIABILITY IN CRITICAL COMPONENTS.
Netzband, Gerald O.
Gonzenbach, Kurt E.
1600, (18):

← 1 2 3 4 5 →