Optical properties of a thin-film stack illuminated by a focused field

被引：0

作者：

Kim, Seong-Sue ^{[1
]}

Kim, Yoon-Ki ^{[1
]}

Park, In-Sik ^{[1
]}

Shin, Sung-Chul ^{[2
]}

机构：

[1] Opto-mechatronics Laboratory, Corp. Res. and Development Center, Samsung Electronics Company, Ltd., 416, Maetan3-Dong, Paldal-Gu, Suwon City, Kyungki-Da, Korea, Republic of

[2] Department of Physics, Ctr. Nanospinics of Spintronic Mat., Korea Adv. Inst. of Sci./Technology, Taejon 305-701, Korea, Republic of

来源：

Journal of the Optical Society of America A: Optics and Image Science, and Vision | 2000年 / 17卷 / 08期

关键词：

Absorptance;

D O I：

10.1364/josaa.17.001454

中图分类号：

学科分类号：

摘要：

Reflectance (R), transmittance (T), and absorptance (A) are calculated for a thin-aim stack illuminated by a focused field. Based on Debye's integral representation, the electric and magnetic fields near focus are obtained, and the formulas for R, T, and A are represented as integrals of Poynting vectors. This formulation is applied to the case of a numerical aperture (N.A.) greater than 1.0 as well as to the case of a N.A. less than 1.0, and the corresponding numerical results are presented. They reveal that R, T, and A vary with N.A. and that the amount of variation increases with layer thickness. © 2000 Optical Society of America.

引用

页码：1454 / 1460

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