X-RAY EMISSION ANALYSIS FOR THICKNESSES MEASUREMENT.

被引：0

作者：

Brunner, Gerhard ^{[1
]}

机构：

[1] Acad of Sciences of the GDR, East Ger, Acad of Sciences of the GDR, East Ger

来源：

Wireworld international | 1986年 / 28卷 / 3-4期

关键词：

COATING THICKNESS - INNER IONIZATION - METALLIC SURFACES - X-RAY SPECTROMETRY;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

(Edited Abstract)

引用

页码：41 / 43

共 50 条

[1] X-ray measurement.
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[10] Change of wave length accompanying X-ray scattering, deduced from absorption measurement.
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