Using microscopy to analyze coating failures

被引：0
|
作者：
Hare, Clive H. [1 ]
机构：
[1] Coating System Design, Inc., Lakeville, MA, United States
来源：
| 2001年 / Technology Publishing Co.卷 / 18期
关键词：
Corrosion protection - Energy dispersive spectroscopy - Failure analysis - Fluorescence - Light absorption - Light reflection - Optical microscopy - Optical resolving power - Scanning electron microscopy - Transmission electron microscopy - Ultraviolet radiation;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The scanning electron microscope with energy dispersive x-ray capabilities, although expensive and complex, has excellent capability to detect and analyze surface phenomena. This paper discusses microscopy in general as a tool for the analysis of coating films.
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