Driving force of electromigration on semiconductor surfaces for Ag/Si(111)

被引：0
|
作者：
机构：
[1] Yasunaga, Hitoshi
[2] Yoda, Shouzou
来源：
Yasunaga, Hitoshi | 1822年 / 30期
关键词：
15;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] DRIVING FORCE OF ELECTROMIGRATION ON SEMICONDUCTOR SURFACES FOR AG/SI(111)
    YASUNAGA, H
    YODA, S
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1991, 30 (08): : 1822 - 1825
  • [2] Substrate-structure dependence of Ag electromigration on Au-precovered Si(111) surfaces
    Shi, Fangxiao
    Shiraki, Ichiro
    Nagao, Tadaaki
    Hasegawa, Shuji
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2000, 39 (7 B): : 4438 - 4442
  • [3] REM STUDY OF SURFACE ELECTROMIGRATION OF GE, AU-CU AND AG ON SI(111) SURFACES
    YAMAGUCHI, H
    TANISHIRO, Y
    YAGI, K
    APPLIED SURFACE SCIENCE, 1992, 60-1 : 79 - 84
  • [4] Substrate-structure dependence of Ag electromigration on Au-precovered Si(111) surfaces
    Shi, FX
    Shiraki, I
    Nagao, T
    Hasegawa, S
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (7B): : 4438 - 4442
  • [5] First-principles quantum transport theory of the enhanced wind force driving electromigration on Ag(111)
    Bevan, Kirk H.
    Guo, Hong
    Williams, Ellen D.
    Zhang, Zhenyu
    PHYSICAL REVIEW B, 2010, 81 (23):
  • [6] Direct observation of electromigration of Si magic clusters on Si(111) surfaces
    Ho, MS
    Hwang, IS
    Tsong, TT
    PHYSICAL REVIEW LETTERS, 2000, 84 (25) : 5792 - 5795
  • [7] Semiconductor-metal-semiconductor transition: valence band photoemission study of Ag/Si(111) surfaces
    Zhang, HM
    Sakamoto, K
    Uhrberg, RIG
    APPLIED SURFACE SCIENCE, 2002, 190 (1-4) : 103 - 107
  • [8] Electromigration of Ag ultrathin films on Si (111) 7×7
    Yasunaga, Hitoshi
    Sakomura, Shigetoshi
    Asaoka, Takashi
    Kanayama, Seiji
    Okuyama, Naoki
    Natori, Akiko
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1988, 27 (09): : 1603 - 1605
  • [9] DRIVING FORCE IN ELECTROMIGRATION
    LANDAUER, R
    WOO, JWF
    PHYSICAL REVIEW B, 1974, 10 (04): : 1266 - 1271
  • [10] SURFACE ELECTROMIGRATION OF IN AND CU ON SI(111) SURFACES STUDIED BY REM
    YAMANAKA, A
    YAGI, K
    SURFACE SCIENCE, 1991, 242 (1-3) : 181 - 190
12345