METALLIZED FILM CAPACITORS SHOW THEIR METTLE.

被引：0
|
作者：
Izumi, Takero [1 ]
机构：
[1] Nitsuko Ltd, Nitsuko Ltd
来源：
| 1600年 / 23期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
2
引用
收藏
相关论文
共 50 条
  • [1] FLUE GAS SCRUBBERS TEST DESIGNERS' METTLE.
    Brosilow, Rosalie
    Welding Design and Fabrication, 1982, 55 (12): : 47 - 48
  • [2] IMPROVEMENTS IN METALLIZED POLYPROPYLENE FILM CAPACITORS TECHNOLOGY
    AGLIETTI, G
    LOGGINI, M
    RINALDI, M
    ELETTROTECNICA, 1972, 59 (10): : 1025 - 1031
  • [3] EVOLUTION OF SMT METALLIZED FILM CAPACITORS.
    Fabbri, C.
    Bernadi, A.
    JEE. Journal of electronic engineering, 1987, 24 (252): : 32 - 37
  • [4] Asymmetrical current distribution in metallized film capacitors
    Joubert, C
    Béroual, A
    Rojat, G
    JOURNAL OF APPLIED PHYSICS, 2004, 95 (11) : 6420 - 6425
  • [5] Investigation of performance degradation in metallized film capacitors
    Godec, M.
    Mandrino, Dj
    Gaberscek, M.
    APPLIED SURFACE SCIENCE, 2013, 273 : 465 - 471
  • [6] Dielectric properties of metallized paper-film capacitors
    Qi, XG
    Ronzello, J
    Boggs, S
    IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2005, 12 (06) : 1235 - 1240
  • [7] Residual lifetime prediction of metallized film pulse capacitors
    Peng, Bao-Hua
    Zhou, Jing-Lun
    Feng, Jing
    Liu, Xue-Min
    Tien Tzu Hsueh Pao/Acta Electronica Sinica, 2011, 39 (11): : 2674 - 2679
  • [8] Electrically induced heat dissipation in metallized film capacitors
    Kong, MG
    Lee, YP
    IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2004, 11 (06) : 1007 - 1013
  • [9] Segmented Electrodes Electrodynamic Destruction in Metallized Film Capacitors
    Belko, Victor O.
    Emelyanov, Oleg A.
    Ivanov, Ivan O.
    PROCEEDINGS OF THE 2017 IEEE RUSSIA SECTION YOUNG RESEARCHERS IN ELECTRICAL AND ELECTRONIC ENGINEERING CONFERENCE (2017 ELCONRUS), 2017, : 1117 - 1119
  • [10] Electric field mapping inside metallized film capacitors
    Nielsen, Dennis A.
    Popok, Vladimir N.
    Pedersen, Kjeld
    2015 61ST ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM (RAMS 2015), 2015,
12345