JOINT SPECIAL ISSUE ON VERY LARGE SCALE INTEGRATION.

被引：0
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作者：
Anon
机构：
来源：
IEEE Transactions on Electron Devices | 1985年 / ED-32卷 / 02期
关键词：
DATA STORAGE; DIGITAL - Random Access - INTEGRATED CIRCUIT MANUFACTURE - SEMICONDUCTOR DEVICES - Modeling - SEMICONDUCTOR DEVICES; MOS - SEMICONDUCTOR DEVICES; MOSFET;
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摘要：
This special issue contains 56 papers also published in the IEEE Journal of Solid-State Circuits, Feb. 1985, vol SC-20, no. 1, under which they are all separately indexed and abstracted. The paper cover the areas of VLSI device processing and patterning, VLSI technologies, VLSI device structures and characteristics, VLSI device /circuit modeling, and VLSI circuits.
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页码：83 / 515
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