Nanometer-displacement detection of optically trapped metallic particles based on critical angle method for small force detection

被引：0
|
作者：
Higurashi, Eiji [1 ]
Sawada, Renshi [1 ]
Ito, Takahiro [1 ]
机构：
[1] NTT Opto-electronics Laboratories, 3-9-11, Midori-cho, Musashino-shi, Tokyo 180-8585, Japan
来源：
Review of Scientific Instruments | / 70卷 / 07期
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页码：3068 / 3073
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