Measurement of the thermal conductivity of thin β-SiC films between 80 K and 600 K

被引:0
|
作者
Jansen, E. [1 ]
Ziermann, R. [1 ]
Obermeier, E. [1 ]
Kroetz, G. [1 ]
Wagner, Ch. [1 ]
机构
[1] Technical Univ of Berlin, Berlin, Germany
来源
Materials Science Forum | 1998年 / 264-268卷 / pt 1期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:631 / 634
相关论文
共 50 条
  • [1] Measurement of the thermal conductivity of thin β-SiC films between 80K and 600K
    Jansen, E
    Ziermann, R
    Obermeier, E
    Krotz, G
    Wagner, C
    SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2, 1998, 264-2 : 631 - 634
  • [2] Thermal conductivity of CVD-diamond films between 80 and 700 K
    Jansen, E
    Schneider, M
    Obermeier, E
    MATERIALS FOR MECHANICAL AND OPTICAL MICROSYSTEMS, 1997, 444 : 117 - 122
  • [3] Optical pump and probe measurement of the thermal conductivity of low-k dielectric thin films
    Daly, BC
    Maris, HJ
    Ford, WK
    Antonelli, GA
    Wong, L
    Andideh, E
    JOURNAL OF APPLIED PHYSICS, 2002, 92 (10) : 6005 - 6009
  • [4] Measurement and correlation of the thermal conductivity of isobutane from 114 K to 600 K at pressures to 70 MPa
    Perkins, RA
    JOURNAL OF CHEMICAL AND ENGINEERING DATA, 2002, 47 (05): : 1272 - 1279
  • [5] Measurement and correlation of the thermal conductivity of propane from 86 K to 600 K at pressures to 70 MPa
    Marsh, KN
    Perkins, RA
    Ramires, MLV
    JOURNAL OF CHEMICAL AND ENGINEERING DATA, 2002, 47 (04): : 932 - 940
  • [6] Measurement and correlation of the thermal conductivity of butane from 135 K to 600 K at pressures to 70 MPa
    Perkins, RA
    Ramires, MLV
    de Castro, CAN
    Cusco, L
    JOURNAL OF CHEMICAL AND ENGINEERING DATA, 2002, 47 (05): : 1263 - 1271
  • [7] Thermal Conductivity of AlN and SiC Thin Films
    Sun Rock Choi
    Dongsik Kim
    Sung-Hoon Choa
    Sung-Hoon Lee
    Jong-Kuk Kim
    International Journal of Thermophysics, 2006, 27 : 896 - 905
  • [8] Thermal conductivity of AlN and SiC thin films
    Choi, Sun Rock
    Kim, Dongsik
    Choa, Sung-Hoon
    Lee, Sung-Hoon
    Kim, Jong-Kuk
    INTERNATIONAL JOURNAL OF THERMOPHYSICS, 2006, 27 (03) : 896 - 905
  • [9] Contactless measurement of the thermal conductivity of thin SiC layers
    Rohmfeld, S
    Hundhausen, M
    Ley, L
    SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2, 1998, 264-2 : 657 - 660
  • [10] THERMAL CONDUCTIVITY AND ELECTRICAL RESISTIVITY OF PURE SILVER BETWEEN 80 AND 350 K
    MATSUMURA, T
    LAUBITZ, MJ
    CANADIAN JOURNAL OF PHYSICS, 1970, 48 (12) : 1499 - +