DIAGNOSTIC MODEL OF SYSTEMS WITH SELF-TESTING.

被引:0
|
作者
Fujiwara, Hideo
Ozaki, Hiroshi
机构
来源
Systems, computers, controls | 1979年 / 10卷 / 05期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
The diagnostic model of systems by Preparata-Metze-Chien assumes the following: (1) a unit is capable of testing other units; and (2) a unit is not able to test itself. A more general diagnostic model is introduced by removing these assumptions, that is, some units may not be able to perform tests while others may have self-testing ability. For this model the following problems are considered: (1) necessary and sufficient conditions to construct a t-diagnosable graph to exist; (2) methods of constructing an optimum t-diagnosable system for a given set of units which satisfy the conditions of (1), (3) necessary and sufficient conditions for a system to be t-diagnosable, and (4) redundancy and criticality of tests in diagnostic graphs.
引用
收藏
页码:58 / 65
相关论文
共 50 条
  • [1] VLSI SPURS SELF-TESTING.
    Lyman, Jerry
    [J]. Electronics, 1980, 53 (27):
  • [2] CIRCUIT MODULE IMPLEMENTS PRACTICAL SELF-TESTING.
    Fasang, Patrick P.
    [J]. Electronics, 1982, 55 (10): : 164 - 167
  • [3] Psychological comorbidity in diabetic patients fearful of self-injecting and/or self-testing.
    Mollema, ED
    Heine, RJ
    van der Ploeg, HM
    Snoek, FJ
    [J]. DIABETOLOGIA, 1999, 42 : A38 - A38
  • [4] Effects of a web-based decision aid regarding diagnostic self-testing. A single-blind randomized controlled trial
    Ickenroth, Martine H. P.
    Grispen, J. E. J.
    de Vries, N. K.
    Dinant, G. J.
    Ronda, G.
    van der Weijden, T.
    [J]. HEALTH EDUCATION RESEARCH, 2016, 31 (03) : 395 - 404
  • [5] On using signature registers as pseudorandom pattern generators in built-in self-testing.
    Kim, Kwanghyun
    Ha, Dong Sam
    Tront, Joseph G.
    [J]. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988, 7 (06) : 919 - 928
  • [6] Indicators of nonadherence among those who self-report regular glucose self-testing.
    Dryfoos, JM
    Ruggiero, L
    Kelly, K
    Rossi, J
    [J]. DIABETES, 1996, 45 : 419 - 419
  • [7] A high-quality sine-wave oscillator for analog built-in self-testing.
    Dominguez, M. A.
    Ausin, J. L.
    Duque-Carillo, And. J. F.
    Torelli, G.
    [J]. 2006 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-11, PROCEEDINGS, 2006, : 3454 - 3457
  • [8] Self-testing of multiprocessor systems with regular diagnostic connections
    Romankevich, V. A.
    [J]. AUTOMATION AND REMOTE CONTROL, 2017, 78 (02) : 289 - 299
  • [9] Self-testing of multiprocessor systems with regular diagnostic connections
    V. A. Romankevich
    [J]. Automation and Remote Control, 2017, 78 : 289 - 299
  • [10] THE EFFECTIVENESS OF SELF-DIAGNOSTIC TESTING IN MICROPROCESSOR-BASED SYSTEMS
    SCHINDHELM, E
    [J]. INSTRUMENTATION IN THE POWER INDUSTRY, VOL 32, 1989, 32 : 87 - 91