Conventional Transmission-Electron-Microscopy Techniques in Convergent-Beam Electron Diffraction

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作者：

Tanaka, Michiyoshi ^{[1
]}

机构：

[1] Department of Physics, Faculty of Science, Tohoku University, Sendai,980, Japan

来源：

| 1600年 / Oxford University Press卷 / 35期

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摘要：

Electron diffraction

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