Application of SPRT for detecting change point in a reliability growth model

被引：0
|
作者：
Jain, Sudha [1 ]
Jain, R.K. [1 ]
机构：
[1] Univ of Toronto, Toronto, Canada
来源：
Microelectronics Reliability | 1994年 / 34卷 / 05期
关键词：
Average sample number - Likelihood ration property - Operating characteristic - Reliability growth models - Sequential probability ratio test;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
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页码：811 / 814
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