Pulse height of MIP's in an n-side silicon microstrip detector after proton irradiation with a fluence of 1 × 1015 p cm-2

被引：0

作者：

Gomez, A. ^{[1
]}

Kroeger, W. ^{[1
]}

Nissen, T. ^{[1
]}

Sadrozinski, H.F.-W. ^{[1
]}

Wichmann, R. ^{[1
]}

Emes, J. ^{[1
]}

Gilchriese, M.G.D. ^{[1
]}

Siegrist, J. ^{[1
]}

Wappler, F. ^{[1
]}

Unno, Y. ^{[1
]}

Ohsugi, T. ^{[1
]}

机构：

[1] Univ of California, Santa Cruz, United States

来源：

IEEE Transactions on Nuclear Science | 1998年 / 45卷 / 3 pt 1期

关键词：

Colliding beam accelerators - Irradiation - Microstrip devices - Particle beams - Protons - Ruthenium - Spurious signal noise - Temperature control;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

We have irradiated an n-side silicon microstrip detector to an equivalent high energy fluence of 1 × 1015 p cm-2 using 55 MeV protons. We determined the median pulse height to be 0.7 fC at a bias voltage of 180 V, and deduced a depletion region of about 80 μm.

引用

页码：327 / 330

共 3 条

[1] Pulse height of MIP's in an n-side silicon microstrip detector after proton irradiation with a fluence of 1x1015 p cm-2
Gomez, A
Kroeger, W
Nissen, T
Sadrozinski, HFW
Wichmann, R
Emes, J
Gilchriese, MGD
Siegrist, J
Wappler, F
Unno, Y
Ohsugi, T
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1998, 45 (03) : 327 - 330
[2] Pulse height of MIP's in an n-side silicon microstrip detector after proton irradiation with a fluence of 1x1015 p cm-2
Gomez, A
Kroeger, W
Nissen, T
Sadrozinski, HFW
Wichmann, R
Emes, J
Gilchriese, MGD
Siegrist, J
Wappler, F
Unno, Y
Ohsugi, T
1997 IEEE NUCLEAR SCIENCE SYMPOSIUM - CONFERENCE RECORD, VOLS 1 & 2, 1998, : 860 - 863
[3] Noise studies of n-strip on n-bulk silicon microstrip detectors using fast binary readout electronics after irradiation to 3x1014 p cm-2
Robinson, D
Allport, PP
Bizzell, J
Buttar, C
Carter, CC
Carter, JR
Goodrick, M
Greenall, A
Hill, JC
Morgan, D
Munday, DJ
Ohsugi, T
Phillips, PW
Riedler, P
Smith, NA
Terada, S
Turner, PR
Unno, Y
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1999, 426 (01): : 28 - 33

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