STATIONARY PHASE APPROXIMATION OF DEFOCUSED IMAGES OF p-n JUNCTIONS.

被引：0
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作者：
Merli, P.G.
Pozzi, G.
机构：
来源：
Optik (Jena) | 1978年 / 51卷 / 01期
关键词：
MICROSCOPES; ELECTRON - Imaging Techniques - SEMICONDUCTOR DEVICES - Microscopic Examination;
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摘要：
The contrast formation in the out-of-focus images of thinned and reverse biased p-n junctions is considered. The phase shift experienced by electrons is described using a simple field model recently presented and discussed. Conditions for the validity of the geometrical theory are investigated and the main features of the out-of-focus patterns predictable by this model are reported.
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页码：39 / 48
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