Comments on the use of the force mode in atomic force microscopy for polymer films

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作者：
Aime, J.P.
Elkaakour, Z.
Odin, C.
Bouhacina, T.
Michel, D.
Curely, J.
Dautant, A.
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Journal of Applied Physics | 1994年 / 76卷 / 02期
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