Empirical study on the complexity metrics of Petri nets

被引：12
|
作者：
Soo, Lee Gang [1 ]
Jung-Mo, Yoon [1 ]
机构：
[1] Han Nam Univ, Tae-jeon, Korea, Republic of
来源：
Microelectronics Reliability | 1992年 / 32卷 / 03期
关键词：
12;
D O I：
10.1016/0026-2714(92)90061-O
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：323 / 329
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