共 50 条
- [1] NONCONTACT OPTICAL MEASURING METHODS OF SILICON WAFER DEFORMATION PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1984, 473 : 149 - 151
- [2] NONCONTACT DEVICE FOR MEASURING THE DIAMETER OF AN OPTICAL FIBER SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1989, 56 (07): : 422 - 425
- [8] Development of surface profile measuring instrument for magnetic rigid disk and micro-waviness assessment 2000, Japanese Soc of Tribologists, Tokyo, Japan (45):