Soft X-ray spectromicroscopy development for materials science at the Advanced Light Source

被引:0
|
作者
Lawrence Berkeley Natl. Laboratory, Berkeley, CA 94720, United States [1 ]
不详 [2 ]
不详 [3 ]
不详 [4 ]
不详 [5 ]
机构
来源
关键词
Number:; DMR-9458060; Acronym:; NSF; Sponsor: National Science Foundation; -; USDOE; Sponsor: U.S. Department of Energy; DCC; Sponsor: Dow Chemical Company;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [1] Soft x-ray spectromicroscopy development for materials science at the advanced light source
    Warwick, T
    Ade, H
    Hitchcock, AP
    Padmore, H
    Rightor, EG
    Tonner, BP
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1997, 84 (1-3) : 85 - 98
  • [2] Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source
    Warwick, T
    Ade, H
    Cerasari, S
    Denlinger, J
    Franck, K
    Garcia, A
    Hayakawa, S
    Hitchcock, A
    Kikuma, J
    Klingler, S
    Kortright, J
    Morisson, G
    Moronne, M
    Rightor, E
    Rotenberg, E
    Seal, S
    Shin, HJ
    Steele, WF
    Tonner, BP
    JOURNAL OF SYNCHROTRON RADIATION, 1998, 5 : 1090 - 1092
  • [3] Soft X-ray optics for spectromicroscopy at the Advanced Light Source
    Padmore, HA
    X-RAY AND INNER-SHELL PROCESSES - 17TH INTERNATIONAL CONFERENCE, 1997, (389): : 193 - 207
  • [4] A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source
    Warwick, T
    Franck, K
    Kortright, JB
    Meigs, G
    Moronne, M
    Myneni, S
    Rotenberg, E
    Seal, S
    Steele, WF
    Ade, H
    Garcia, A
    Cerasari, S
    Delinger, J
    Hayakawa, S
    Hitchcock, AP
    Tyliszczak, T
    Kikuma, J
    Rightor, EG
    Shin, HJ
    Tonner, BP
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (08): : 2964 - 2973
  • [5] Scanning soft X-ray spectromicroscopy at the Pohang Light Source: commissioning results
    Shin, HJ
    Lee, MK
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2001, 467 : 909 - 912
  • [6] PolLux: A new facility for soft x-ray spectromicroscopy at the Swiss Light Source
    Raabe, J.
    Tzvetkov, G.
    Flechsig, U.
    Boege, M.
    Jaggi, A.
    Sarafimov, B.
    Vernooij, M. G. C.
    Huthwelker, T.
    Ade, H.
    Kilcoyne, D.
    Tyliszczak, T.
    Fink, R. H.
    Quitmann, C.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2008, 79 (11):
  • [7] Soft x-ray spectromicroscopy
    Voss, J
    Fornefett, M
    Kunz, C
    Moewes, A
    Pretorius, M
    Ranck, A
    Schroeder, M
    Wedemeier, V
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1996, 80 : 329 - 335
  • [8] Coherent soft X-ray branchline at the advanced light source
    Rosfjord, R
    Kemp, C
    Denham, P
    Gullikson, E
    Batson, P
    Rekawa, S
    Attwood, D
    SYNCHROTRON RADIATION INSTRUMENTATION, 2004, 705 : 448 - 449
  • [9] Soft x-ray scanning transmission spectromicroscopy of cementitious materials
    Daehn, R.
    Vespa, M.
    Shuh, D. K.
    Tyliszczak, T.
    Wieland, E.
    GEOCHIMICA ET COSMOCHIMICA ACTA, 2007, 71 (15) : A197 - A197
  • [10] Soft X-ray scanning transmission spectromicroscopy of actinide materials
    Shuh, D. K.
    Tyliszczak, Tolek
    Nico, Peter S.
    Daehn, Rainer
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2007, 234