REPRESENTATION AND INTERPRETATION OF OVERLAPPED LINE SEGMENTS FOR AUTOMATIC RECOGNITION OF LSI CELL DRAWINGS.

被引:0
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作者
Hitachi Ltd, Kokubunji, Jpn, Hitachi Ltd, Kokubunji, Jpn [1 ]
机构
来源
Syst Comput Jpn | 1986年 / 7卷 / 49-59期
关键词
INTEGRATED CIRCUITS; LSI - PATTERN RECOGNITION;
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摘要
This paper discussed first the representation of the overlap portion, and proposes a new representation method which has less ambiguity in the automatic interpretation of the overlap portion and makes the drawing easy for the designer. The algorithm is proposed which automatically interprets the overlap portion by this representation. The algorithm is composed of three parts: recognition of overlap portion, and estimation of the overlapped paths. A program based on the proposed algorithm is combined into the cell-drawing input device. The result of recognition for an actual cell drawing is presented.
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