COMPREHENSIVE INVESTIGATION ON CHARACTERISTICS OF TYPICAL PERIODIC FILM SYSTEMS CONSISTING OF TWO THIN-FILM MATERIALS.

被引:0
|
作者
He, Zhaolin [1 ]
Chen, Huiguang [1 ]
机构
[1] Xing Tian Optical Instrument Inst, Guiyang, China, Xing Tian Optical Instrument Inst, Guiyang, China
来源
Guangxue Xuebao/Acta Optica Sinica | 1986年 / 6卷 / 10期
关键词
HIGH REFLECTANCE ZONES - PERIODIC FILM SYSTEMS - TWO THIN-FILM MATERIALS;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:954 / 959
相关论文
共 50 条
  • [1] ANALYSIS OF THIN-FILM RESISTANCE NETWORKS WITH TWO RESISTIVE MATERIALS.
    Iwakura, Hiroshi
    Arakawa, Teruaki
    Electronics & communications in Japan, 1980, 63 (03): : 72 - 77
  • [2] New materials consisting of multicomponent oxides for thin-film gas sensors
    Miyata, T
    Minami, T
    Shimokawa, K
    Kakumu, T
    Ishii, M
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1997, 144 (07) : 2432 - 2436
  • [3] Vapor sorption mechanisms in plasma polymerized thin-film sensor materials.
    Weinkauf, DH
    Russell, SP
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2000, 220 : U372 - U372
  • [4] A comprehensive study for the plasmonic thin-film solar cell with periodic structure
    Sha, Wei E. I.
    Choy, Wallace C. H.
    Chew, Weng Cho
    OPTICS EXPRESS, 2010, 18 (06): : 5993 - 6007
  • [5] TWO-DIMENSIONAL PERIODIC STRUCTURES IN THIN-FILM LASERS
    SYCHUGOV, VA
    TISHCHENKO, AV
    KHAKIMOV, AA
    KVANTOVAYA ELEKTRONIKA, 1982, 9 (01): : 44 - 48
  • [6] PIEZOELECTRICITY IN THIN-FILM MATERIALS
    FOSTER, NF
    JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, 1981, 70 (06): : 1609 - 1614
  • [7] Thin-film active materials
    Carman, GP
    Frontiers of Engineering, 2005, : 41 - 45
  • [8] INVESTIGATION OF A DESIGN METHOD FOR OPTICAL THIN-FILM SYSTEMS
    SZALAI, G
    FLUCK, K
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1984, 473 : 268 - 269
  • [9] An investigation of thin-film coating/substrate systems by nanoindentation
    Li, J
    Thostenson, ET
    Chou, TW
    Riester, L
    JOURNAL OF ENGINEERING MATERIALS AND TECHNOLOGY-TRANSACTIONS OF THE ASME, 1998, 120 (02): : 154 - 162
  • [10] OVERWRITE CHARACTERISTICS OF THIN-FILM HEAD AND MEDIA SYSTEMS
    AKOH, S
    TAKAGISHI, M
    HIROSHIMA, T
    IEEE TRANSACTIONS ON MAGNETICS, 1990, 26 (05) : 2454 - 2456