A self-consistent technique for the analysis of the temperature dependence of current-voltage and capacitance-voltage characteristics of a tunnel metal-insulator-semiconductor structure

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作者：

Cova, P. ^{[1
]}

Singh, A. ^{[1
]}

Masut, R.A. ^{[2
]}

机构：

[1] Departamento de Física, Universidad de Oriente, Laboratorio de Simulación de Dispositivos Semiconductores, Apartado 124, Cumaná 6101, Sucre, Venezuela

[2] Département de Génie Physique, Groupe de Recherche en Physique et Technologie des Couches Minces, Ecole Polytechnique, C.P. 6079, Succ. Centre-ville, Montréal, QC H3C 3A7, Canada

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| 1600年 / American Institute of Physics Inc.卷 / 82期

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[1] Self-consistent technique for the analysis of the temperature dependence of current-voltage and capacitance-voltage characteristics of a tunnel metal-insulator-semiconductor structure
Cova, P.
Singh, A.
Masut, R.A.
Journal of Applied Physics, 1997, 82 (10)
[2] A self-consistent technique for the analysis of the temperature dependence of current-voltage and capacitance-voltage characteristics of a tunnel metal-insulator-semiconductor structure
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