MOVING TOWARD FUTURE ELECTRON DEVICES.

被引:0
|
作者
Sakamoto, Tsunenori
机构
来源
JEE, Journal of Electronic Engineering | 1982年 / 19卷 / 187期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:28 / 31
相关论文
共 50 条
  • [1] Multibeam cathode for electron devices.
    Djubua, BC
    Polivnikova, OV
    IVESC2004: THE 5TH INTERNATIONAL VACUUM ELECTRON SOURCES CONFERENCE PROCEEDINGS, 2004, : 135 - 137
  • [2] Electron injection in organic electronic devices.
    Smith, DL
    Campbell, IH
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2001, 222 : U325 - U325
  • [3] Toward single-molecule electronic devices.
    Michi, J
    Magnera, TF
    Smith, JR
    Pecka, J
    Reisinger, A
    Trujillo, M
    Miller, JR
    Kirby, JP
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2001, 222 : U188 - U188
  • [4] MOVING TOWARD FUTURE
    SCHORR, AL
    SOCIAL WORK, 1971, 16 (02) : 2 - 2
  • [5] FUTURE DEMAND FOR GALLIUM ARSENIDE SEMICONDUCTOR DEVICES.
    Jones, S.
    Thomas, C.B.
    Wilshire, B.
    Metals and Materials (Institute of Metals), 1986, 2 (06): : 353 - 356
  • [6] TRANSMISSION ELECTRON MICROSCOPY OF SEMICONDUCTOR MATERIALS AND DEVICES.
    Marcus, R.B.
    Scanning Electron Microscopy, 1985, v : 1001 - 1009
  • [7] ON THE ANALYTICAL CALCULATION OF FIELDS IN ELECTRON OPTICAL DEVICES.
    Kasper, E.
    Scherle, W.
    Optik (Jena), 1982, 60 (04): : 339 - 352
  • [8] Recent development and future prospects of Power SiC devices.
    Nakamura, T.
    Nakano, Y.
    Aketa, M.
    Hanada, T.
    2014 INTERNATIONAL POWER ELECTRONICS CONFERENCE (IPEC-HIROSHIMA 2014 - ECCE-ASIA), 2014, : 2074 - 2074
  • [9] Surface Mounted Devices. Methods; Components; Future.
    Kirchner, Gerhard
    Elektronik Munchen, 1987, 36 (22): : 141 - 144
  • [10] SCANNING ELECTRON MICROSCOPY STUDIES OF SILICON ON INSULATOR DEVICES.
    Drake, Donald J.
    Fernquist, Richard
    Hawkins, William G.
    Scanning Electron Microscopy, 1984, (pt 4) : 1579 - 1584