ANALYSIS AND MEASUREMENT OF THE SHOT-NOISE REDUCTION FACTOR.

被引：0
|
作者：
Saito, Shigebumi
Fujii, Yoichi
Iwamoto, Akito
机构：
来源：
Electronics and Communications in Japan (English translation of Denshi Tsushin Gakkai Zasshi) | 1972年 / 55卷 / 10期
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中图分类号：
TN [电子技术、通信技术];
学科分类号：
0809 ;
摘要：
The shot-noise reduction factor in an electron tube was obtained by a Monte Carlo method, and the Tien dip and peak near the plasma frequency were found to be reasonably attributable to limited computing time and the type of random numbers used. By the use of the cepstrum method, a smooth reduction factor with respect to frequency was obtained. The reduction factor was measured to high accuracy by the Saito-Fujii photoelectric-emission method, and the results found to be in good agreement with the improved Monte Carlo values.
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页码：69 / 76
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