Fluctuations in semiconductors with deep traps in a strong electric field

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SHAPIRO BI

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| 1971年 / 13卷 / 03期

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摘要：

Expressions are obtained for the spectral density of the current fluctuations in a short- circuited circui, and the voltage fluctuations under fixed current conditions. The effect of the trapping coefficient- electric field relationship on the spectral density of the electrical noise is investigated. See also English translation in Sov Phys-Solid State v 13 n 3 Sept 1971 p 615-19

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页码：745 / 751

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[1] FLUCTUATIONS IN SEMICONDUCTORS WITH DEEP TRAPS IN A STRONG ELECTRIC FIELD
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