ANNUAL BOOK OF ASTM STANDARDS, 1979 - PART 42. EMISSION, MOLECULAR, AND MASS SPECTROSCOPY; CHROMATOGRAPHY; RESINOGRAPHY; MICROSCOPY; COMPUTERIZED SYSTEMS; SURFACE ANALYSIS.

被引：0

作者：

Anon

机构：

来源：

American Society for Testing and Materials, Book of ASTM Standards | 1979年 / pt 42期

关键词：

715 Electronic Equipment; General Purpose and Industrial - 741 Light; Optics and Optical Devices - 801 Chemistry - 943 Mechanical and Miscellaneous Measuring Instruments;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

共 3 条

[1] ANNUAL BOOK OF ASTM STANDARDS, 1981, PART 42: EMISSION, MOLECULAR, AND MASS SPECTROSCOPY; CHROMATOGRAPHY; RESINOGRAPHY; MICROSCOPY; COMPUTERIZED SYSTEMS; SURFACE ANALYSIS.
Anon
Annual Book of ASTM Standards, 1981, (pt 42):
[2] 1980 ANNUAL BOOK OF ASTM STANDARDS, PT 42, EMISSION, MOLECULAR AND MASS-SPECTROSCOPY, CHROMATOGRAPHY, RESINOGRAPHY, MICROSCOPY, COMPUTERIZED SYSTEMS, SURFACE-ANALYSIS - AMER-SOC-TESTING-MAT
不详
ENERGY SOURCES, 1983, 7 (02): : 199 - 199
[3] ANNUAL BOOK OF ASTM STANDARDS, 1980, PART 42: ANALYTICAL METHODS - SPECTROSCOPY; CHROMATOGRAPHY; COMPUTERIZED SYSTEMS.
Anon
Annual Book of ASTM Standards, 1980,

← 1 →