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- [1] LUMINESCENCE METHOD AND DEVICE FOR THE CONTROL OF UNIFORMITY OF DIELECTRIC COATINGS ON SILICON-WAFERS INDUSTRIAL LABORATORY, 1985, 51 (12): : 1133 - 1137
- [2] ELECTROCHEMICAL METHOD TO MEASURE THE DEFECT-FREE ZONE IN SILICON WAFERS. IBM technical disclosure bulletin, 1983, 26 (05): : 2374 - 2376
- [3] SILICON DEVICE SURFACE PROTECTION WITH DIELECTRIC FILMS AND COATINGS JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (01): : 284 - &
- [4] CONTROL OF PROFILES OF DIELECTRIC AND METALLIC COATINGS ON SILICON PRIBORY I TEKHNIKA EKSPERIMENTA, 1972, (04): : 222 - &
- [8] DIFFRACTION METHOD OF COMPLEX QUALITY-CONTROL OF CONDUCTING SURFACES AND DIELECTRIC COATINGS SOVIET JOURNAL OF NONDESTRUCTIVE TESTING-USSR, 1986, 22 (02): : 104 - 107
- [10] Method of creating local semi-insulating regions on silicon wafers for device isolation and realization of high-Q inductors IEEE Electron Device Lett, 12 (461-462):