Novel 360° three-dimensional profilometry

被引：0
|
作者：
Zhao, Hong [1 ]
Song, Yuanhe [1 ]
Li, Genqian [1 ]
Yue, Kaiduan [1 ]
Chen, Wenyi [1 ]
Tan, Yushan [1 ]
机构：
[1] Xi'an Jiaotong Univ, Xi'an, China
来源：
Guangxue Xuebao/Acta Optica Sinica | 1999年 / 19卷 / 04期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
(Edited Abstract)
引用
收藏
页码：497 / 500
相关论文
共 50 条
  • [1] Automated 360° profilometry of a three-dimensional diffuse object and its reconstruction by use of the shading model
    Department of Applied Electronics, Hokkaido Institute of Technology, 7-15 Maeda, Teine-ku, Sapporo 006, Japan
    不详
    不详
    Appl. Opt., 22 (4476-4480):
  • [2] Automated 360 degrees profilometry of a three-dimensional diffuse object and its reconstruction by use of the shading model
    Ohara, H
    Konno, H
    Sasaki, M
    Suzuki, M
    Murata, K
    APPLIED OPTICS, 1996, 35 (22): : 4476 - 4480
  • [3] Three-dimensional optical profilometry for artwork inspection
    Spagnolo, GS
    Guattari, G
    Sapia, C
    Ambrosini, D
    Paoletti, D
    Accardo, G
    JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS, 2000, 2 (05): : 353 - 361
  • [4] Three-dimensional profilometry using a Dammann grating
    Zhang, Jun
    Zhou, Changhe
    Wang, Xiaoxin
    APPLIED OPTICS, 2009, 48 (19) : 3709 - 3715
  • [5] Three-dimensional profilometry of solid objects in rotation
    Trujillo-Schiaffino, Gerardo
    Portillo-Amavisca, Nicolas
    Salas-Peimbert, Didia P.
    la Rosa, Laura Molina-de
    Almazan-Cuellar, Saul
    Corral-Martinez, Luis F.
    RIAO/OPTILAS 2007, 2008, 992 : 924 - 928
  • [6] Three-dimensional nanoscale optical vortex profilometry
    Sokolenko, Bogdan V.
    Poletaev, Dmitrii A.
    NANOIMAGING AND NANOSPECTROSCOPY V, 2017, 10350
  • [7] Projector recalibration of three-dimensional profilometry system
    Zhou, Ping
    Yu, Yunlei
    Cai, Guochao
    Huang, Shuo
    APPLIED OPTICS, 2016, 55 (09) : 2294 - 2300
  • [8] Profilometry and optical slicing by passive three-dimensional imaging
    DaneshPanah, Mehdi
    Javidi, Bahram
    OPTICS LETTERS, 2009, 34 (07) : 1105 - 1107
  • [9] Fast Three-Dimensional Profilometry with Large Depth of Field
    Zhang, Wei
    Zhu, Jiongguang
    Han, Yu
    Zhang, Manru
    Li, Jiangbo
    SENSORS, 2024, 24 (13)
  • [10] Three-dimensional profilometry system incorporating a MEMS scanner
    Yoshizawa, Toru
    Wakayama, Toshitaka
    OPTICAL INSPECTION AND METROLOGY FOR NON-OPTICS INDUSTRIES, 2009, 7432
12345