USE OF EXTERNAL BEAM IN PIXE.

被引：0
|
作者：
Lodhi, A.S.
Sioshansi, P.
机构：
来源：
| 1600年 / 142期
关键词：
801 Chemistry - 932 High Energy Physics; Nuclear Physics; Plasma Physics;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
2
引用
收藏
页码：1 / 2
相关论文
共 50 条
  • [1] USE OF EXTERNAL BEAM IN PIXE
    LODHI, AS
    SIOSHANSI, P
    NUCLEAR INSTRUMENTS & METHODS, 1977, 142 (1-2): : 45 - 47
  • [2] CORROSION STUDIES WITH PIXE.
    Chaudhri, M.Anwar
    Crawford, A.
    Nuclear instruments and methods, 1981, 181 (1-3): : 93 - 96
  • [3] DATABASE FOR THICK TARGET PIXE.
    Cohen, David D.
    Clayton, E.
    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 1986, B22 (1-3) : 59 - 63
  • [4] LIMITS OF SPATIAL RESOLUTION IN PIXE.
    Legge, G.J.F.
    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 1600, B22 (1-3): : 115 - 120
  • [5] PIXE RESEARCH WITH AN EXTERNAL BEAM
    CHEN, JX
    LI, HK
    REN, CG
    TANG, GH
    WANG, XD
    YANG, FC
    YAO, HY
    NUCLEAR INSTRUMENTS & METHODS, 1980, 168 (1-3): : 437 - 440
  • [6] ON THE BROMINE METABOLISM IN URAEMIA, MEASURED WITH PIXE.
    Vis, R.D.
    Oe, P.L.
    Bos, A.J.J.
    Verheul, H.
    Nuclear instruments and methods, 1981, 181 (1-3): : 293 - 295
  • [7] PIXE. A novel technique for elemental analysis
    1600, (113):
  • [8] COMPUTER PROGRAMS FOR QUANTITATIVE ANALYSIS BY PIXE.
    Maeda, Kuniko
    Uda, Masayuki
    Rika Gaku Kenkyujo hokoku, 1982, 58 (4-5): : 96 - 101
  • [9] Applications of external beam PIXE at RMIT
    Moser, M.
    Bubb, I.F.
    Johnston, P.N.
    Bouanani, M.El
    Stannard, W.B.
    Short, R.C.
    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 1998, 139 (1-4): : 164 - 168
  • [10] Applications of external beam PIXE at RMIT
    Moser, M
    Bubb, IF
    Johnston, PN
    El Bouanani, M
    Stannard, WB
    Short, RC
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1998, 139 (1-4): : 164 - 168
12345