Characterization of windows and filters for coherent X-ray beamlines

被引:0
|
作者
Suzuki, Yoshio
Momose, Atsushi
Sugiyama, Hiroshi
机构
来源
Journal of Synchrotron Radiation | 1998年 / 5卷 / 03期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
Beryllium windows and graphite heat absorbers used in coherent X-ray beamlines must be optically flat. If the optical path through the window varies by more than λ/4, the X-ray wave front will be distorted after passing through the window, and the divergence of the X-ray beam may be increased. This reduces the beam coherence. Beryllium, graphite and Kapton films have been tested using ultra-small-angle X-ray scattering. Wave-front distortion was also directly observed by means of phase-contrast X-ray microradiography. The measured increase of angular divergence is about 4 μrad. The wave-front distortion is larger than 2π (optical path difference of λ). These are serious problems for utilizing coherent X-ray beams.
引用
收藏
页码:596 / 599
相关论文
共 50 条
  • [1] Characterization of windows and filters for coherent X-ray beamlines
    Suzuki, Y
    Momose, A
    Sugiyama, H
    JOURNAL OF SYNCHROTRON RADIATION, 1998, 5 : 596 - 599
  • [2] Characterization of beryllium windows for coherent x-ray optics
    Goto, Shunji
    Yabashi, Makina
    Tamasaku, Kenji
    Ishikawa, Tetsuya
    SYNCHROTRON RADIATION INSTRUMENTATION, PTS 1 AND 2, 2007, 879 : 1057 - +
  • [3] Characterization of beryllium foils for coherent x-ray applications of synchrotron radiation and XFEL beamlines
    Goto, Shunji
    Takahashi, Sunao
    Inubushi, Yuichi
    Tono, Kensuke
    Sato, Takahiro
    Yabashi, Makina
    ADVANCES IN X-RAY/EUV OPTICS AND COMPONENTS VI, 2011, 8139
  • [4] Characterization of X-ray area detectors for synchrotron beamlines
    Ponchut, C
    JOURNAL OF SYNCHROTRON RADIATION, 2006, 13 : 195 - 203
  • [5] A hierarchical approach for modeling X-ray beamlines: application to a coherent beamline
    del Rio, Manuel Sanchez
    Celestre, Rafael
    Glass, Mark
    Pirro, Giovanni
    Herrera, Juan Reyes
    Barrett, Ray
    da Silva, Julio Cesar
    Cloetens, Peter
    Shi, Xianbo
    Rebuffi, Luca
    JOURNAL OF SYNCHROTRON RADIATION, 2019, 26 : 1887 - 1901
  • [6] X-ray spectroscopy station for sample characterization at ELI Beamlines
    Zymakova, A.
    Precek, M.
    Picchiotti, A.
    Blachucki, W.
    Zymak, I.
    Szlachetko, J.
    Vanko, G.
    Nemeth, Z.
    Sa, J.
    Wiste, T.
    Andreasson, J.
    SCIENTIFIC REPORTS, 2023, 13 (01)
  • [7] Ronchi test for characterization of X-ray nanofocusing optics and beamlines
    Uhlen, Fredrik
    Rahomaki, Jussi
    Nilsson, Daniel
    Seiboth, Frank
    Sanz, Claude
    Wagner, Ulrich
    Rau, Christoph
    Schroer, Christian G.
    Vogt, Ulrich
    JOURNAL OF SYNCHROTRON RADIATION, 2014, 21 : 1105 - 1109
  • [8] X-ray spectroscopy station for sample characterization at ELI Beamlines
    A. Zymaková
    M. Precek
    A. Picchiotti
    W. Błachucki
    I. Zymak
    J. Szlachetko
    G. Vankó
    Z. Németh
    J. Sá
    T. Wiste
    J. Andreasson
    Scientific Reports, 13
  • [9] X-ray source - Beamlines debut
    Jacoby, M
    CHEMICAL & ENGINEERING NEWS, 2005, 83 (27) : 8 - 8
  • [10] X-ray instrumentation for SR beamlines
    Kovalchuk, MV
    Shilin, YN
    Zheludeva, SI
    Aleshko-Ozhevsky, OP
    Arutynyan, EH
    Kheiker, DM
    Kreines, AY
    Lider, VV
    Pashaev, EM
    Shilina, NY
    Shishkov, VA
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2000, 448 (1-2): : 112 - 119