Defect production in ion-implanted yttria-stabilized zirconia investigated by positron depth profiling

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[1] [1,2,Saudé, S.
[2] 1,Grynszpan, R.I.
[3] Anwand, W.
[4] Brauer, G.
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Grynszpan, R.I. (robert.grynszpan@iscsa.cnrs.fr) | 1600年 / Elsevier Ltd卷 / 382期
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