Raman study of solid HBr under high pressure and low temperature

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Kume, T. [1 ,2 ]
Tsuji, T. [1 ,2 ]
Sasaki, S. [1 ,2 ]
Shimizu, H. [1 ,2 ]
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[1] Dept. of Elec. and Electronics Eng., Faculty of Engineering, Gifu University, Yangido 1-1, Gifu 501-1193, Japan
[2] CREST, Japan Science and Technology Corp., Kawaguchi, Saitama 332-0012, Japan
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页码:795 / 798
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