Spectroscopic measurements of thin organic films using near-field scanning optical microscopy

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作者：
Nagahara, L.A. [1 ]
Yanagi, H. [1 ]
Tokumoto, H. [1 ]
机构：
[1] Joint Research Cent for Atom, Technology - Angstrom Technology, Partnership, Ibaraki, Japan
来源：
Nanotechnology | 1997年 / 8卷 / 3 A期
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