Ultrafast x-ray diffraction using a streak-camera detector in averaging mode

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Department of Physics, University of California, Berkeley, Berkeley, CA 94720, United States [1 ]
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Opt. Lett. | / 13卷 / 1012-1014期
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We demonstrate an apparatus for measuring time-dependent x-ray diffraction. X-ray pulses from a synchrotron are diffracted by a pair of Si(111) crystals and detected with an x-ray streak camera that has single-shot resolution of better than 1 ps. The streak camera is driven by a photoconductive switch, which is triggered by 100-fs laser pulses at a repetition rate of 1 kHz. The laser and the streak camera are synchronized with the synchrotron pulses. In the averaging mode, trigger jitter results in 2-ps temporal resolution. We measured the duration of 5-keV pulses from the Advanced Light Source synchrotron to be 70 ps. © 1997 Optical Society of America.
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