APPARATUS FOR PROBING ELECTRIC FIELDS IN DIELECTRIC FILMS BY THE ALBEDO METHOD.

被引：0
|
作者：
Andreev, O.V.
Sapozhkov, Yu.I.
Evdokimov, O.B.
Kononov, B.A.
Yagushkin, N.I.
机构：
来源：
Instruments and experimental techniques New York | 1982年 / 25卷 / 6 pt 2期
关键词：
ELECTRIC FIELD MEASUREMENT - Instruments;
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学科分类号：
摘要：
A method and apparatus are described for probing electric fields in dielectric films to a depth less than equivalent to 10 mg/cm**2 with electrons possessing an energy of up to 100 kev. The method is based on the influence of the electric field on the factor of electron backscattering from a dielectric film.
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页码：1510 / 1512
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