Heat resistance of Sn-9Zn solder/Cu interface with or without coating

被引:0
|
作者
Suganuma, Katsuaki [1 ]
Murata, Toshikazu [1 ]
Noguchi, Hiroji [1 ]
Toyoda, Yoshitaka [1 ]
机构
[1] Inst. of Scientific and Indust. Res., Osaka University, Mihogaoka 8-1, Ibaraki, Osaka 567-0047, Japan
关键词
Interfacial morphology;
D O I
10.1557/jmr.2000.0126
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [1] Heat resistance of Sn-9Zn solder/Cu interface with or without coating
    Katsuaki Suganuma
    Toshikazu Murata
    Hiroji Noguchi
    Yoshitaka Toyoda
    Journal of Materials Research, 2000, 15 : 884 - 891
  • [2] Heat resistance of Sn-9Zn solder/Cu interface with or without coating
    Suganuma, K
    Murata, T
    Noguchi, H
    Toyoda, Y
    JOURNAL OF MATERIALS RESEARCH, 2000, 15 (04) : 884 - 891
  • [3] Electromigration of Sn-9Zn solder in contact with Cu
    Lin, KL
    Fang, YH
    9TH INTERNATIONAL SYMPOSIUM ON ADVANCED PACKAGING MATERIALS: PROCESSES, PROPERTIES AND INTERFACES, 2004 PROCEEDINGS, 2004, : 17 - 20
  • [4] Interfacial reaction of Sn-9Zn/Cu joint with Cu particle-rein forced composite solder Sn-9Zn
    School of Mechanical Engineering, South China University of Technology, Guangzhou 510640, China
    不详
    Hanjie Xuebao, 2007, 5 (105-108):
  • [5] Interfacial Reaction between Sn-9Zn/Sn Double Layers Solder and Cu
    Ma, H. T.
    An, L. L.
    Qu, L.
    Wang, J.
    Gu, L. Y.
    Huang, M. L.
    2012 13TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING (ICEPT-HDP 2012), 2012, : 392 - 396
  • [6] Effect of electromigration on the tensile strength of Cu/Sn-9Zn/Cu solder interconnects
    Huang, Mingliang
    Zhang, Fei
    Yang, Fan
    Zhao, Ning
    2014 15TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2014, : 1190 - 1193
  • [7] Reliability studies of Sn-9Zn/Cu solder joints with aging treatment
    Yoon, JW
    Jung, SB
    JOURNAL OF ALLOYS AND COMPOUNDS, 2006, 407 (1-2) : 141 - 149
  • [8] Reliability studies of Sn-9Zn/Cu solder joints with aging treatment
    Yoon, Jeong-Won
    Jung, Seung-Boo
    Journal of Alloys and Compounds, 2006, 407 (1-2): : 141 - 149
  • [9] Electromigration-induced void formation at the Cu5Zn8/solder interface in a Cu/Sn-9Zn/Cu sandwich
    Kuo, Shih-Ming
    Lin, Kwang-Lung
    JOURNAL OF ELECTRONIC MATERIALS, 2008, 37 (10) : 1611 - 1617
  • [10] Electromigration-Induced Void Formation at the Cu5Zn8/Solder Interface in a Cu/Sn-9Zn/Cu Sandwich
    Shih-Ming Kuo
    Kwang-Lung Lin
    Journal of Electronic Materials, 2008, 37 : 1611 - 1617