New, simple, test-set for on-wafer characterization of millimeter-wave electro-optic devices

被引：0
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作者：
Ferrero, A. [1 ]
Ghione, G. [1 ]
Pirola, M. [1 ]
Frassati, D. [1 ]
机构：
[1] Politecnico di Torino, Torino, Italy
来源：
IEEE MTT-S International Microwave Symposium Digest | 2000年 / 3卷
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摘要：
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页码：1607 / 1610
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