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- [2] New applications of quadrupole-based secondary ion mass spectrometry (SIMS) in microelectronics SEMICONDUCTOR CHARACTERIZATION: PRESENT STATUS AND FUTURE NEEDS, 1996, : 387 - 391
- [6] TANDEM QUADRUPOLE FOURIER-TRANSFORM MASS-SPECTROMETRY ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1988, 196 : 106 - ANYL
- [10] TANDEM MASS-SPECTROMETRY - PRINCIPLES AND APPLICATIONS ZEITSCHRIFT FUR CHEMIE, 1990, 30 (05): : 157 - 168