CHARACTERIZATION OF Co-O THIN FILMS BY X-RAY FLUORESCENCE USING CHEMICAL SHIFTS OF ABSORPTION EDGES.

被引：0
|
作者：
Sakurai, Kenji [1 ]
Iida, Atsuo [1 ]
Gohshi, Yohichi [1 ]
机构：
[1] Univ of Tokyo, Tokyo, Jpn, Univ of Tokyo, Tokyo, Jpn
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes | 1987年 / 26卷 / 11期
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摘要：
9
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页码：1937 / 1938
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