Incorporating organizational issues into root-cause analysis

被引:0
|
作者
Tuli, R.W. [1 ]
Apostolakis, G.E. [1 ]
机构
[1] Univ of California, Los Angeles, United States
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:3 / 16
相关论文
共 50 条
  • [1] Incorporating organizational issues into root-cause analysis
    Tuli, RW
    Apostolakis, GE
    PROCESS SAFETY AND ENVIRONMENTAL PROTECTION, 1996, 74 (B1) : 3 - 16
  • [2] Identifying organizational deficiencies through root-cause analysis
    Tuli, RW
    Apostolakis, GE
    Wu, JS
    NUCLEAR TECHNOLOGY, 1996, 116 (03) : 334 - 359
  • [3] Beyond root-cause analysis
    Bergman, BLS
    Fundin, AP
    Gremyr, IC
    Johansson, PM
    ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM, 2002 PROCEEDINGS, 2002, : 140 - 146
  • [4] ROOT-CAUSE ANALYSIS AND CLEANROOM
    ADAMS, T
    IEEE SOFTWARE, 1994, 11 (04) : 4 - 4
  • [5] Root-cause analysis gets to the bottom of it
    Johnston, R
    POWER, 2001, 145 (05) : 24 - +
  • [6] Systematic and organizational issues implicated in post-hospitalization suicides of medically hospitalized patients: A study of root-cause analysis reports
    Riblet, Natalie
    Shiner, Brian
    Mills, Peter
    Rusch, Brett
    Hemphill, Robin
    Watts, Bradley V.
    GENERAL HOSPITAL PSYCHIATRY, 2017, 46 : 68 - 73
  • [7] Root-Cause Analysis with Interactive Decision Trees
    Detzner, Alexander
    Rueckschloss, Ramona
    Eigner, Martin
    2020 24TH INTERNATIONAL CONFERENCE INFORMATION VISUALISATION (IV 2020), 2020, : 322 - 327
  • [8] A root-cause analysis methodfor faultdiagnosisin condenser
    Han, Banglei
    Zhang, Chao
    Xie, Chu
    2019 5TH INTERNATIONAL CONFERENCE ON ADVANCES IN ENERGY RESOURCES AND ENVIRONMENT ENGINEERING (ICAESEE 2019), 2020, 446
  • [9] Improvements in root-cause analysis of drillstring vibration
    Greenwood, Jeremy A., 1600, Society of Petroleum Engineers (SPE) (68):
  • [10] Unsupervised Root-Cause Analysis for Integrated Systems
    Pan, Renjian
    Zhang, Zhaobo
    Li, Xin
    Chakrabarty, Krishnendu
    Gu, Xinli
    2020 IEEE INTERNATIONAL TEST CONFERENCE (ITC), 2020,