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- [1] ANALYSIS OF THE MOVING-PHOTOCARRIER-GRATING TECHNIQUE FOR THE DETERMINATION OF MOBILITY AND LIFETIME OF PHOTOCARRIERS IN SEMICONDUCTORSPHYSICAL REVIEW B, 1995, 51 (16): : 10579 - 10590HAKEN, UHUNDHAUSEN, MLEY, L
- [3] Determination of the photocarrier lifetime in amorphous silicon with the moving photocarrier grating techniqueJapanese Journal of Applied Physics, Part 2: Letters, 1994, 33 (10 A):Witt, ChristianHaken, UweHundhausen, Martin
- [4] DETERMINATION OF THE PHOTOCARRIER LIFETIME IN AMORPHOUS-SILICON WITH THE MOVING PHOTOCARRIER GRATING TECHNIQUEJAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1994, 33 (10A): : L1386 - L1388WITT, CHAKEN, UHUNDHAUSEN, M
- [5] Analysis of the moving photocarrier grating technique for semiconductors of high defect densityPHYSICAL REVIEW B, 2001, 64 (10):Schmidt, JAHundhausen, MLey, L
- [6] The chopped moving photocarrier grating techniqueREVIEW OF SCIENTIFIC INSTRUMENTS, 2019, 90 (12):Kopprio, LeonardoVentosinos, FedericoSchmidt, Javier
- [7] DETERMINATION OF THE PHOTOCARRIER LIFETIME IN AMORPHOUS-SILICON WITH THE MOVING PHOTOCARRIER GRATING TECHNIQUE (VOL 33, PG L1386, 1994)JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1994, 33 (12B): : L1809 - L1812WITT, CHAKEN, UHUNDHAUSEN, M
- [8] Analysis of the oscillating photocarrier grating techniqueJOURNAL OF PHYSICS D-APPLIED PHYSICS, 2011, 44 (29)Ventosinos, F.Budini, N.Longeaud, C.Schmidt, J. A.
- [9] CARRIER MOBILITY AND LIFETIME IN A-SI-H DETERMINED BY THE MOVING GRATING TECHNIQUEJOURNAL OF NON-CRYSTALLINE SOLIDS, 1993, 164 : 497 - 500HAKEN, UHUNDHAUSEN, MLEY, L