Neutron reflection studies of phase separation and transesterification in thin film polymer blends

被引：0
|
作者：
Wong, Apollo P.Y. [1 ]
Karim, Alamgir [1 ]
Han, Charles C. [1 ]
机构：
[1] Argonne Natl Lab, Argonne, United States
来源：
Physica B: Condensed Matter | 1996年 / 221卷 / 1-4期
关键词：
Anisotropy - Annealing - Esterification - Neutron reflection - Phase separation - Polycarbonates - Polymer blends - Polymethyl methacrylates - Silicon - Thermal effects - Thin films;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Neutron reflection is used to investigate the evolution of structure and surface segregation in thin films of a binary polymer blend, deuterated polymethamethacrylate (dPMMA) and polycarbonate (PC). This blend film simultaneously undergoes phase separation and reaction by trans-esterification. A large increase of the critical scattering length density in the first few minutes of annealing at 200 °C reflected the rapid layering of the dPMMA at the silicon surface. Further annealing progressively smeared out the specular peak in favor of the off-specular signal in the form of a butterfly pattern reflecting the in-plane anisotropy of the thin film phase separation.
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页码：301 / 305
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